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Longer Lasting Hips

Mechanical Engineers' Scanning Technique Helps Yesterday's Art and Today's Hip Implants

May 1, 2009

Mechanical engineers devised a scanning technique that uses a 3-D image to calculate the various stresses on an object. Researchers tested the technique on Michelangelo's statue "David" and identified the areas that are most likely to crack--enabling them to work toward a solution to ease the strain. Similarly, this method could help doctors determine how bones might respond to certain stresses--helping them choose the best implant for a particular patient.

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Science Insider

ABOUT FRACTURES: A fractured bone is the same thing as a broken bone. Bones break when they are unable to support the energy placed on them. That energy can be acute, as from a car crash or a two-story fall, or chronic, from low-energy repetitive activities. The latter is responsible for stress fractures, an overuse injury commonly seen in athletes. The increased demand placed on the bone causes it to remodel and become stronger in areas of higher stress, but if the repetitive demands become too great, a stress fracture can result.

ART AS INSPIRATION: Using a technique to analyze the stresses on structures standing in place, engineers predicted the places where Michelangelo's famous statue "David" may be at risk. After completing a three dimensional scan of the statue, their computer technique predicted points of stress that correlated with the location of actual cracks in the statue. The technique can be used to analyze the weak points of many structures, from bridges to artificial hip implants to car parts.

The American Society of Civil Engineers and the Institute of Electrical and Electronics Engineers, Inc.-USA, contributed to the information contained in the TV portion of this report.

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On The Web: Stresses on Statue of David

To Go Inside This Science:
Michael K Freytag
Madison, WI 53706
(608) 837-0628
mkfreytag@wisc.edu

Dr. Vadim Shapiro
vshapiro@engr.wisc.edu

The American Society of Civil Engineers
Reston, VA 20191-4400
Joan Buhrman
jbuhrman@asce.org
703-295-6404

Institute of Electrical and Electronics Engineers, Inc.
IEEE
IEEE-USA
Pender McCarter
p.mccarter@ieee.org