Sharper Electron Microscope Pix

Close-up view of a special "phase plate" for improving the contrast capability of transmission electron microscopes (TEM). The red beam symbolizes the unscattered electron waves, which are shifted in phase by an electostatic field leaking from the unshielded ring electrode. The blue beams symbolize the scattered electron waves, which pass by the phase plate unchanged.

Schematic diagram of the TEM equipped with the phase plate.

Reported by: Schultheiss et al. in the March 2006 issue of Review of Scientific Instruments

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