 |
 |
 |
 |
 |
|
|
 |
|
 |
|
Scanning electron microscope picture of a scanning gate probe. One of the tips is the probe for a scanning tunneling microscope. The other tip is a gate which, operating very close to the STM probe, allows sharper spectroscopy of atoms in the sample under scrutiny. The two tips are about 200 nm apart.
reported by: Gurevich et al., in the 17 January Applied Physics Letters