American Institute of Physics
SEARCH AIP
home contact us sitemap
Physics News Update
Number 773, April 12, 2006 by Phil Schewe and Ben Stein

Sharper Focusing of Hard X-Rays

Sharper focusing of hard X-rays has been achieved with a device developed at Argonne National Lab.

Because of their high energy, X-rays are hard to focus: they can be reflected from a surface but only at a glancing angle (less than a tenth of a degree); they can be refracted but the index of refraction is very close to 1, so that making efficient lenses becomes a problem; and they can be diffracted, but the thick, variable pitch grating required for focusing is tricky to achieve.

The Argonne device is of the diffraction type, and it consists of a stack of alternating layers of metal and silicon, made by depositing progressively thicker layers (see figure at Physics News Graphics). When the X-rays fall on such a structure, nearly edge-on, what they see is a grating pattern (called a linear zone plate) consisting of a sort of bar-code pattern.

The Argonne device succeeds so well in focusing X-rays because the position of the zones can be controlled to within nanometer tolerances through the deposition process, and the depth of the zones that the X-rays experience can be made arbitrarily long -- microns long -- by merely cutting a thicker section of the multilayer wafer. In tests so far, one of these zone plates, very slightly tilted to the X-rays coming out of a synchrotron source, has focused 20-kiloelectronvolt X-rays to a line only 30 nanometer wide, better than previously possible.

According to Argonne researcher Brian Stephenson (stephenson@anl.gov, 630-252-3214), an ideal version of this kind of X-ray lens, which they call a Multilayer Laue Lens (MLL), should be able to focus X-rays to a spot of 1 nanometer or less. The likely uses for a better X-ray lens are in full-field microscopy (making a magnified X-ray image of a sample) or in scanning probe microscopy (by scanning the beam across a sample).

Kang et al., Physical Review Letters, 31 March 2006
Contact Brian Stephenson, stephenson@anl.gov, 630-252-3214
Image at Physics News Graphics

Nano-Earthquakes: Acoustic Waves Excite Artificial Molecules

By absorbing photons from a laser, an atom can be excited to any of various discrete energy levels allowed by quantum mechanics. What about artificial atoms? A quantum dot, created by the same lithographic methods used to prepare electronic chips, is nearly a zero-dimensional zone of semiconducting material; as with electrons inside atoms, electrons inside the confinement of a quantum dot will also possess only a restricted menu of allowed energies.

The same is true for a pair of quantum dots 200 nanometer apart; with just the right voltage applied, electrons can tunnel from one dot to the other. In fact, an electron, considered as a spread-out quantum wave phenomenon, can be considered to reside in both dots at the same time, a property which makes the quantum-dot "molecule" potentially useful for carrying out quantum computing operations.

Now, a group of scientists have been able to probe, and to change, the quantum energy states of a double quantum dot with sound waves, or more particularly surface acoustic waves excited in the substrate supporting the dots.

The acoustic waves, less than 1 nanometer in amplitude, ripple through the surface for distances as long as hundreds of microns as a sort of nano-earthquake, are created through the process of piezoelectricity; a small voltage is sent into a series of tiny electrodes painted onto the surface. This excites the faint acoustic waves (see figure at Physics News Graphics).

The acoustic-dot arrangement, mediated by the delicate interactions between electrons and phonons, can work in both directions: The quantum dots can be used to monitor the acoustic waves -- otherwise difficult to detect because of their tiny energy -- or the acoustic waves can be used to interrogate the electronic status of the dots, which makes possible the aforesaid quantum-information applications.

The researchers involved work at the University of Twente and the Delft University of Technology (Netherlands), NTT Corporation, Tokyo Institute of Technology, and University of Tokyo (Japan), and Jilin University (China).

Naber et al., Physical Review Letters, 7 April 2006
Contact Wouter Naber, w.j.m.naber@utwente.nl
Image at Physics News Graphics

Back to Physics News Update