A practical X-ray photoelectron spectroscopy guide aims to improve the method’s widespread usage

The use of surface sensitive X-ray photoelectron spectroscopy (XPS) in research and applications has become increasingly important and widespread in the last few decades. However, this rise in popularity also results in more new users, some of which are not experienced with XPS and occasionally create incorrect analysis and reporting of XPS data. To help mitigate this issue, the new paper provides a guide that details the first steps in planning, conducting and reporting XPS measurements.

Baer et al. present the first steps in using XPS and provide general guidelines for identifying if the specific objectives for the analysis are compatible with XPS and if the samples can be properly prepared and measured by the instruments. The paper also identifies issues relevant to planning, conducting, and reporting an XPS measurement, and provides sources for further detailed information on XPS usage.

XPS has become essential in a wide array of research disciplines including materials science, chemistry, biology, and environmental and atmospheric sciences. With its ease of use and ability to analyze a range of samples, it is now one of the most commonly applied methods of surface analysis. However, XPS is not suitable for all research questions and its misapplication and even its misinterpretation when it is a useful method, can lead to erroneous results and poor reproducibility in studies.

According to the authors, the new paper is the first in a series on the proper use of XPS. Subsequent papers will discuss carrying out any measurements with appropriate cautions, and extracting the data and information appropriately.

Source: “Practical guides for x-ray photoelectron spectroscopy: First steps in planning, conducting and reporting XPS measurements,” by Donald R. Baer, Kateryna Artyushkova, Christopher Richard Brundle, James E. Castle, Mark H. Engelhard, Karen J. Gaskell, John T. Grant, Richard T. Haasch, Matthew R. Linford, Cedric J. Powell, Alexander G. Shard, Peter M. A. Sherwood, and Vincent S. Smentkowski, Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films (2019). The article can be accessed at https://doi.org/10.1116/1.5065501 .